Submissions from 2011
Quantification of Self-Damping of Power MOSFET in a Synchronous Buck Converter, Keong Kam, David Pommerenke, Ankit Bhargava, Robert J. Steinfeld, Cheungwei Lam, and Federico Centola
Software-Based Analysis of the Effects of Electrostatic Discharge on Embedded Systems, Pratik Rajesh Maheshwari, Tianqi Li, Jongsung Lee, Byongsu Seol, Sahra Sedigh, and David Pommerenke
Systematic Analysis and Engineering of Absorbing Materials Containing Magnetic Inclusions for EMC Applications, Marina Koledintseva, Jianfeng Xu, Soumya De, James L. Drewniak, Yongxue He, and Richard Johnson
The Evaluation Method for ESD Immunity of Components in Terms of Soft Error, Jaedeok Lim, Jongsung Lee, Byongsu Seol, Argha Nandy, and David Pommerenke
Unbalanced Currents in Integrated Circuits and their Effect on TEM Cell Emissions, Kuifeng Hu, Haixiao Weng, Daryl G. Beetner, David Pommerenke, and James L. Drewniak
Submissions from 2010
A New Mixing Rule for Predicting of Frequency-Dependent Material Parameters of Composites, Konstantin Rozanov, Marina Koledintseva, and James L. Drewniak
A Systematic Approach to PCB Material Characterization using Time Domain TRL Calibration, Victor Khilkevich, Marina Koledintseva, Vysakh Sivarajan, Dazhao Liu, Brice Achkir, Hongxia Ning, and James L. Drewniak
Capacitance Calculation for Offset Via Structures using an Integral Approximation Approach Based on Finite Element Method, Hanfeng Wang, Yaojiang Zhang, James L. Drewniak, Jun Fan, and Bruce Archambeault
Causal RLGC( Ƒ ) Models for Transmission Lines from Measured S-Parameters, Jianmin Zhang, James L. Drewniak, David Pommerenke, Marina Koledintseva, Richard E. DuBroff, Wheling Cheng, Zhiping Yang, Qinghua B. Chen, and Antonio Orlandi
Complex Permittivity and Permeability Measurements and Finite-Difference Time-Domain Simulation of Ferrite Materials, Jianfeng Xu, Marina Koledintseva, Yaojiang Zhang, Yongxue He, Bill Matlin, Richard E. DuBroff, James L. Drewniak, and Jianmin Zhang
DC Blocking Via Structure Optimization and Measurement Correlation for SerDes Channels, Jianmin Zhang, Qinghua B. Chen, Jun Fan, James L. Drewniak, Antonio Orlandi, and Bruce Archambeault
Design and Modeling for Chip-to-Chip Communication at 20 Gbps, Jianmin Zhang, Qinghua B. Chen, Kelvin Qiu, Antonio Ciccomancini Scogna, Martin Schauer, Gerardo Romo, James L. Drewniak, and Antonio Orlandi
Effects of TVS Integration on System Level ESD Robustness, Wei Huang, Jeffrey C. Dunnihoo, and David Pommerenke
Evaluation of Propagation Characteristics for PCB Traces with Periodic Roughness using ASM-FDTD Method, Minshen Wang, Rui Qiang, Ji Chen, Marina Koledintseva, Amendra Koul, and James L. Drewniak
FDTD Modeling of Absorbing Materials for EMI Applications, Jianfeng Xu, Marina Koledintseva, Soumya De, Andriy V. Radchenko, Richard E. DuBroff, James L. Drewniak, Yongxue He, and Richard Johnson
Field Injection Probes for Field Coupled Electrostatic Discharge Sensitivity Database of ICs, Zhen Li, Jiang Xiao, Byongsu Seol, Jongsung Lee, and David Pommerenke
Hardware-In-The-Loop Simulation of Hybrid Control Unit for 4x4 Military Vehicles, Seungtaek Jeong, H. Kim, K. Han, S. Kim, J. Yoo, Y. Lee, and DongHyun Kim
Improvements in GMI Probe Design for Time-Domain Transient Current Measurements, Fan Zhou, Songping Wu, David Pommerenke, Yoshiki Kayano, Hiroshi Inoue, Kenji Tan, and Jun Fan
Investigation of Noise Coupling from Switching Power Supply to Signal Nets, Songping Wu, Keong Kam, David Pommerenke, Bill Cornelius, Hao Shi, Matthew Herndon, and Jun Fan
Measurement Methodology for Establishing an IC ESD Sensitivity Database, Zhen Li, Jiang Xiao, Byongsu Seol, Jongsung Lee, and David Pommerenke
Measuring IC Switching Current Waveforms using a GMI Probe for Power Integrity Studies, Fan Zhou, Songping Wu, David Pommerenke, Yoshiki Kayano, Hiroshi Inoue, Kenji Tan, and Jun Fan
Model for ESD LCD Upset of a Portable Product, Jiang Xiao, David Pommerenke, Fan Zhou, James L. Drewniak, Hideki Shumiya, Takashi Yamada, and Kenji Araki
Modeling of Noise Coupling inside Multilayer Printed Circuit Boards using Cavity Model and Segmentation Technique, Zhenwei Yu, Jun Fan, Samuel R. Connor, Bruce Archambeault, and James L. Drewniak
Modeling of the Immunity of ICs to EFTs, Ji Zhang, Jayong Koo, Daryl G. Beetner, Richard Moseley, Scott Herrin, and David Pommerenke
Near Field Probe for Detecting Resonances in EMC Application, Jiang Xiao, Dazhao Liu, David Pommerenke, Wei Huang, Peng Shao, Xiao Li, Jin Min, and Giorgi Muchaidze
Physics-Based Via Model Development and Verification, Jianmin Zhang, Qinghua B. Chen, Zhiping Yang, James L. Drewniak, and Antonio Orlandi
Planar Transmission Line Method for Characterization of Printed Circuit Board Dielectrics, Jianmin Zhang, Marina Koledintseva, Giulio Antonini, James L. Drewniak, Antonio Orlandi, and Konstantin Rozanov
Predicting of Wideband Electromagnetic Responses of Composites Containing Magnetic Inclusions, Konstantin Rozanov, Marina Koledintseva, and James L. Drewniak
Probe Characterization and Data Process for Current Reconstruction by Near Field Scanning Method, Wei Huang, Dazhao Liu, Jiang Xiao, David Pommerenke, Jin Min, and Giorgi Muchaidze
Stressed Jitter Analysis for Physical Link Characterization, Nitin Radhakrishnan, Brice Achkir, Jun Fan, and James L. Drewniak
Stub Length Prediction for Back-Drilled Vias using a Fast Via Tool, Jianmin Zhang, Qinghua B. Chen, Hanfeng Wang, Jun Fan, Antonio Orlandi, and James L. Drewniak
Surface Impedance Approach to Calculate Loss in Rough Conductor Coated with Dielectric Layer, Marina Koledintseva, Amendra Koul, Fan Zhou, James L. Drewniak, and Scott Hinaga
Thermal Effects on PCB Laminate Material Dielectric Constant and Dissipation Factor, Scott Hinaga, Marina Koledintseva, James L. Drewniak, Amendra Koul, and Fan Zhou
Submissions from 2009
Active Probes for Creating H-Field Probes for Flat Frequency Response, Surbhi Mittal, Ji Zhang, David Pommerenke, James L. Drewniak, Kuifeng Hu, and Xiaopeng Dong
A Nonlinear Microcontroller Power Distribution Network Model for the Characterization of Immunity to Electrical Fast Transients, Jayong Koo, Lijun Han, Scott Herrin, Richard Moseley, Ross Carlton, Daryl G. Beetner, and David Pommerenke
Cavities' Identification Algorithm for Power Integrity Analysis of Complex Boards, S. Cicerone, Antonio Orlandi, Bruce Archambeault, Samuel R. Connor, Jun Fan, and James L. Drewniak
Developing an SI Tool Set for Engineering Design Discovery, Physical Insight, and Education, Amendra Koul, Andrew Conrad, Russell Jackson, Alex Packard, Jianjian Song, Edward D. Wheeler, and James L. Drewniak
Development of a Concept Inventory Test for Signal and Power Integrity in Electronic Design, Jianjian Song, Edward D. Wheeler, David Pommerenke, and James L. Drewniak
Effect of Conductor Surface Roughness upon Measured Loss and Extracted Values of PCB Laminate Material Dissipation Factor, Scott Hinaga, Marina Koledintseva, Praveen K. Reddy Anmula, and James L. Drewniak
Experimental Research on Wheel Slip Control for the HEV In-Wheel Motor Along the Rough Terrain with Rectangular Obstacles, J. I. Seo, K. Chang, S. K. Jung, H. S. Choi, J. Y. Kim, and DongHyun Kim
Extraction of Equivalent Inductance in Package-PCB Hierarchical Power Distribution Network, Jingook Kim, Jaemin Kim, Liehui Ren, Jun Fan, Joungho Kim, and James L. Drewniak
Frequency-Dependent Via Inductances for Accurate Power Distribution Network Modeling, Liehui Ren, Jingook Kim, Gang Feng, Bruce Archambeault, James L. Knighten, James L. Drewniak, and Jun Fan
Impedance of an Infinitely Large Parallel-Plane Pair and Its Applications in Engineering Modeling, Arun Reddy Chada, Yaojiang Zhang, Gang Feng, James L. Drewniak, and Jun Fan
Improved Technique for Extracting Parameters of Low-Loss Dielectrics on Printed Circuit Boards, Amendra Koul, Praveen K. Reddy Anmula, Marina Koledintseva, James L. Drewniak, and Scott Hinaga
Investigation of Mixed-Mode Input Impedance of Multi-Layer Differential Vias for Impedance Matching with Traces, Hanfeng Wang, Wheling Cheng, Jianmin Zhang, John Fisher, Lin Zhu, James L. Drewniak, and Jun Fan
Material Parameter Extraction using Time-Domain TRL (t-TRL) Measurements, Abhilash Rajagopal, Brice Achkir, Marina Koledintseva, Amendra Koul, and James L. Drewniak
Measurement of Electromagnetic Parameters and FDTD Modeling of Ferrite Cores, Jianfeng Xu, Marina Koledintseva, Yongxue He, Richard E. DuBroff, James L. Drewniak, Bill Matlin, and Andrea Orlando
Modeling of Shielding Composite Materials and Structures for Microwave Frequencies, Marina Koledintseva, James L. Drewniak, Richard E. DuBroff, Konstantin Rozanov, and Bruce Archambeault
Using a Single-Ended TRL Calibration Pattern to De-Embed Coupled Transmission Lines, Jianmin Zhang, Qinghua B. Chen, Zhiqiang Qiu, James L. Drewniak, and Antonio Orlandi
Submissions from 2008
A Concise Multiple Scattering Method for Via Array Analysis in a Circular Plate Pair, Yaojiang Zhang, Jun Fan, Arun Reddy Chada, and James L. Drewniak
