Field Injection Probes for Field Coupled Electrostatic Discharge Sensitivity Database of ICs
Abstract
An ESD (Electrostatic Discharge) sensitivity database gives a guidance in estimating if, for a given ESD scenario and IC location soft-error (e.g., resets) problems are likely to occur or not. This paper reports on the field probes used.
Recommended Citation
Z. Li et al., "Field Injection Probes for Field Coupled Electrostatic Discharge Sensitivity Database of ICs," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2010, Fort Lauderdale, FL), pp. 329 - 333, Institute of Electrical and Electronics Engineers (IEEE), Jul 2010.
The definitive version is available at https://doi.org/10.1109/ISEMC.2010.5711295
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2010: Jul. 25-30, Fort Lauderdale, FL)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electrostatic Discharge Sensitivities; Field Injection; Electromagnetic Compatibility; Electromagnetism; Electrostatic Discharge; Probes; Electrostatic Devices
International Standard Book Number (ISBN)
978-1-4244-6305-3
International Standard Serial Number (ISSN)
2158-110X
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2010
