Probe Characterization and Data Process for Current Reconstruction by Near Field Scanning Method

Abstract

Previously a measurement technique for ESD current spreading on a PCB using near field scanning was developed in order to connect the local ESD sensitivity to system level ESD failures in time and spatial domain. The concept of such scanning methodology is proved and several scanning results were processed. However the validation, precision and weakness of such methodology need to be further investigated before the application of such scanning methodology on complex circuit or system. This article investigates the current reconstruction by near field scanning technique and methodology. It studies the probe factors including coupling frequency response characterization and deconvolution method, spatial resolution for scanning and orthogonal-scan data combine process.

Meeting Name

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (2010: Apr. 12-16, Bejing, China)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Complex Circuits; Coupling Frequencies; Current Reconstruction; Current Spreading; Data Process; Deconvolution Method; Measurement Techniques; Near-field Scanning; Scan Data; Spatial Domains; Spatial Resolution; System-level ESD; Electromagnetic Compatibility; Electromagnetism; Electrostatic Devices; Electrostatic Discharge; Frequency Response; Probes; Time Domain Analysis; Scanning

International Standard Book Number (ISBN)

978-1-4244-5621-5

International Standard Serial Number (ISSN)

2162-7673

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Apr 2010

Link to Full Text

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