Measuring IC Switching Current Waveforms using a GMI Probe for Power Integrity Studies
Abstract
IC switching current is the main noise source of many power integrity issues in printed circuit boards. Accurate measurement of the current waveforms is critical for an effective power distribution network design. In this paper, using a giant magnetoimpedance (GMI) probe for this purpose is studied. A side-band detection and demodulation system is built up to measure various time-domain waveforms using an oscilloscope. It is found that the GMI probes are potentially suitable for this kind of time-domain measurements, but probe designs and measurement setups need further improvements for this application.
Recommended Citation
F. Zhou et al., "Measuring IC Switching Current Waveforms using a GMI Probe for Power Integrity Studies," Proceedings of the 2010 Asia-Pacific Symposium on Electromagnetic Compatibility (2010, Bejing, China), pp. 317 - 320, Institute of Electrical and Electronics Engineers (IEEE), Apr 2010.
The definitive version is available at https://doi.org/10.1109/APEMC.2010.5475607
Meeting Name
2010 Asia-Pacific Symposium on Electromagnetic Compatibility (2010: Apr. 12-16, Bejing, China)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Accurate Measurement; Band Detection; Current Waveforms; Demodulation System; Giant Magnetoimpedance; Measurement Setup; Noise Source; Power Distribution Network Design; Power Integrity; Probe Design; Switching Currents; Time Domain Measurement; Time-domain Waveforms; Distributed Parameter Networks; Electromagnetic Compatibility; Electromagnetism; Printed Circuit Boards; Printed Circuit Manufacture; Probes
International Standard Book Number (ISBN)
978-1-4244-5621-5
International Standard Serial Number (ISSN)
2162-7673
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Apr 2010