Near Field Probe for Detecting Resonances in EMC Application

Abstract

Resonances degrade the product's EMI or immunity performance at resonance frequencies. Near field scanning techniques, like EMI scanning or susceptibility scanning determine the local behaviour, but fail to connect the local behaviour to the system level behaviour. Resonating structures form part of the coupling paths, i.e., identifying them will aid in understanding system level behaviour of products. In this article, a near field probe (patent pending) is proposed to detecting the resonances frequencies, locations or resonating structures and their Q-factors. The probe is suitable for integration into an automatic scanning system for analysing resonances of PCBs, cables, structural elements etc. The mechanism of the probe has been verified with full wave tools (CST MWS and Ansoft HESS). Two samples of application are presented.

Meeting Name

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (2010: Apr. 12-16, Bejing, China)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

At Resonance; Automatic Scanning System; Coupling Paths; Full Waves; near Field Probes; Near-field Scanning; Q-factors; Resonating Structures; Structural Elements; System Levels; Electromagnetic Compatibility; Electromagnetic Field Measurement; Electromagnetism; Polychlorinated Biphenyls; Probes; Scanning; Resonance

International Standard Book Number (ISBN)

978-1-4244-5621-5

International Standard Serial Number (ISSN)

2162-7673

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Apr 2010

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