Measurement of Electromagnetic Parameters and FDTD Modeling of Ferrite Cores
Abstract
The paper describes a methodology for an efficient design of novel products based on magneto-dielectric (ferrite) materials with desirable frequency responses that satisfy EMC and SI requirements. The methodology starts from estimating complex permittivity and permeability of these materials. This requires measurement techniques, approximation resultant frequency characteristics for permittivity and permeability using a curve-fitting procedure, and development of a full-wave numerical simulation tool that could deal with frequency-dispersive materials. An example of a ferrite material measurement, constitutive parameters extraction using a genetic algorithm, and corresponding FDTD modeling over the frequency range from 10 to 500 MHz is provided.
Recommended Citation
J. Xu et al., "Measurement of Electromagnetic Parameters and FDTD Modeling of Ferrite Cores," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2009, pp. 83 - 88, Institute of Electrical and Electronics Engineers (IEEE), Aug 2009.
The definitive version is available at https://doi.org/10.1109/ISEMC.2009.5284620
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2009: Aug. 17-21, Austin, TX)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Complex Permittivity; Constitutive Parameters; Dispersive Materials; Efficient Designs; Electromagnetic Parameters; FDTD Modeling; Ferrite Cores; Ferrite Materials; Frequency Characteristic; Frequency Ranges; Measurement Techniques; Numerical Simulation; Capillarity; Computer Simulation; Curve Fitting; Dielectric Materials; Electromagnetic Compatibility; Electromagnetism; Ferrite; Finite Difference Time Domain Method; Permittivity; Plastic Molds; Frequency Response
International Standard Book Number (ISBN)
978-1424442676
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2009