Model for ESD LCD Upset of a Portable Product

Abstract

A hybrid method is developed to model Electro-Static Discharge (ESD) LCD (Liquid Crystal Display) upset in a portable product. It combines ESD scanning, full-wave simulation and circuit simulation. This methodology is applied in the investigation of system-level ESD problem of the LCD of the portable product by the following steps. First, the sensitive area of the portable product causing the failure is located by ESD scanning. Using the local injection measurement currents, a behavioural SPICE model is then developed to simulate the ESD failure. Third, a full wave block-level model is used to extract the current densities at the sensitive regions; those current densities are imported into the SPICE model to predict ESD upset levels. The combined model is verified by testing its ability to simulate the upset level of four system level ESD test conditions, leading to satisfactory results.

Meeting Name

IEEE International Symposium on Electromagnetic Compatibility (2010: Jul. 25-30, Fort Lauderdale, FL)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Combined Model; ESD; Full Waves; Full-Wave Simulations; Hybrid Method; Injection Measurement; LCD; Level Model; Portable Products; Sensitive Area; Soft-Error; SPICE Model; System-Level ESD; System-Level ESD Test; Ability Testing; Circuit Simulation; Electromagnetic Compatibility; Electromagnetism; Electrostatic Devices; Electrostatic Discharge; Liquid Crystal Displays; SPICE

International Standard Book Number (ISBN)

978-1424463053

International Standard Serial Number (ISSN)

2158-110X

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Jul 2010

Link to Full Text

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