Frequency-Dependent Via Inductances for Accurate Power Distribution Network Modeling
Abstract
In power distribution network (PDN) modeling, interconnection inductance can play a critical role. It often determines the effectiveness of a component, such as a decoupling capacitor. This paper studies a typical one-plane-pair PDN structure with parallel power and ground planes and vertical vias in between. This work improves the conventional lumped circuit model for the PDN by introducing a model for the inductance of each via that is frequency-dependent. This frequency dependency is obtained from a rigorous cavity model formulation. The improved lumped circuit model is validated with the cavity model and the HFSS full-wave model. Further, the frequency-dependent mutual inductance between two vias can have either a positive or a negative value depending on via locations in the PDN structure, which is an interesting property that has not been reported.
Recommended Citation
L. Ren et al., "Frequency-Dependent Via Inductances for Accurate Power Distribution Network Modeling," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2009, Austin, TX), pp. 63 - 68, Institute of Electrical and Electronics Engineers (IEEE), Aug 2009.
The definitive version is available at https://doi.org/10.1109/ISEMC.2009.5284628
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2009: Aug. 17-21, Austin, TX)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Cavity Model; Decoupling Capacitor; Frequency Dependencies; Frequency-Dependent; Full-Wave Model; Ground Planes; In-Between; Lumped Circuit Models; Mutual Inductance; Negative Values; Parallel Power; Power Distribution Network; Distributed Parameter Networks; Electromagnetic Compatibility; Inductance; Lumped Parameter Networks; Plastic Molds; Electric Network Analysis
International Standard Book Number (ISBN)
978-1424442676; 978-1424442669
International Standard Serial Number (ISSN)
2158-110X; 2158-1118
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2009 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2009