Measurement Methodology for Establishing an IC ESD Sensitivity Database

Abstract

Electrostatic Discharge (ESD) can disturb ICs and lead to soft-errors in electronic devices. If every IC is characterized by the manufacturer for its ESD sensitivity, the levels at which the IC will be disturbed can be expected. In this paper, a method to establish such ESD sensitivity database on transient field sensitivity of ICs in typical electronic systems by different manufacturers is introduced. The database is aimed to sufficiently represent the behaviours of ICs, then ESD related field coupled problems at a certain location within a system can be estimated. Probes and field injection methods of both electric field and magnetic field are presented.

Meeting Name

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (2010: Apr. 12-16, Bejing, China)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Coupled Problems; Electric Field and Magnetic Field; Electronic Device; Electronic Systems; Field Injection; Measurement Methodology; Soft Error; Transient Fields; Database Systems; Electric Fields; Electromagnetic Compatibility; Electromagnetism; Electrostatic Discharge; Magnetic Fields; Magnetic Materials; Electrostatic Devices

International Standard Book Number (ISBN)

978-1-4244-5621-5

International Standard Serial Number (ISSN)

2162-7673

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Apr 2010

Link to Full Text

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