Investigation of Noise Coupling from Switching Power Supply to Signal Nets
Abstract
Noise coupled from switched-mode power supply to signal nets can cause severe signal integrity problems because of the existence of fast switching voltages and currents in the circuit. In this paper, noise coupling mechanism from a synchronous buck converter to a nearby signal trace is studied using a hybrid non-linear model, which combines the synchronous buck converter circuit model and the passive electromagnetic model of the PCB coupling. General design guidelines to mitigate the noise coupling in practical printed circuit board (PCB) designs are provided based on the modeling results.
Recommended Citation
S. Wu et al., "Investigation of Noise Coupling from Switching Power Supply to Signal Nets," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2010, Fort Lauderdale, FL), pp. 79 - 84, Institute of Electrical and Electronics Engineers (IEEE), Jul 2010.
The definitive version is available at https://doi.org/10.1109/ISEMC.2010.5711251
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2010: Jul. 25-30, Fort Lauderdale, FL)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Design Guidelines; Electromagnetic Models; Fast Switching; Modeling Results; Noise Coupling; Non-linear Model; Printed Circuit Board Designs; Signal Traces; Signal-integrity Problems; Switched Mode Power Supplies; Switching Power Supplies; Synchronous Buck Converter; Coupled Circuits; DC-DC Converters; Electric Power Supplies to Apparatus; Electromagnetic Compatibility; Electromagnetism; Electronic Equipment Manufacture; Power Electronics; Printed Circuit Design; Printed Circuit Boards
International Standard Book Number (ISBN)
978-1424463053
International Standard Serial Number (ISSN)
2158-110X
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2010 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2010