Both undergraduate and graduate students at Missouri S&T have an opportunity to get involved in research that will help determine the way that electronic products of the future are designed. Research in the Missouri S&T EMC Laboratory is sponsored by companies that are leaders in the electronics industry. Many of these projects are funded by the Center for Electromagnetic Compatibility, a group of companies with a common interest in electromagnetic compatibility problems and solutions.

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Submissions from 2015

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Common-Mode Filters with Interdigital Fingers for Harmonics Suppression and Lossy Materials for Broadband Suppression, Qian Liu, Guanghua Li, Victor Khilkevich, and David Pommerenke

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Conducted-Emission Modeling for a Switched-Mode Power Supply (SMPS), Yansheng Wang, Siqi Bai, Xinyun Guo, Shuai Jin, Yaojiang Zhang, Joakim Eriksson, Lijuan Qu, Jingyu Huang, and Jun Fan

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Crosstalk Impact of Periodic-Coupled Routing on Eye Opening of High-Speed Links in PCBs, Arun Reddy Chada, Bhyrav Mutnury, Jun Fan, and James L. Drewniak

Dependence of ESD Charge Voltage on Humidity in Data Centers: Part II - Data Analysis, Atieh Talebzadeh, Abhishek Patnaik, Xu Gao, Mahdi Moradian, David E. Swenson, and David Pommerenke

Dependence of ESD Charge Voltage on Humidity in Data Centers: Part III - Estimation of ESD-Related Risk in Data Centers using Voltage Level Extrapolation and Chebyshev's Inequality, Xu Gao, Atieh Talebzadeh, Mahdi Moradian, Yunan Han, David E. Swenson, and David Pommerenke

Dependence of ESD Charge Voltage on Humidity in Data Centers: Part I - Test Methods, Atieh Talebzadeh, Mahdi Moradian, Yunan Han, Abhishek Patnaik, David E. Swenson, and David Pommerenke

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Design Criteria and Error Sensitivity of Time-Domain Channel Characterization (TCC) for Asymmetry Fixture De-Embedding, Changwook Yoon, Mikheil Tsiklauri, Mikhail Zvonkin, Qinghua Bill Chen, Alexander Razmadze, Aman Aflaki, Jingook Kim, Jun Fan, and James L. Drewniak

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Designing a 3-D Printing-Based Channel Emulator with Printable Electromagnetic Materials, Xiangyang Jiao, Hui He, Wei Qian, Guanghua Li, Guangyao Shen, Xiao Li, Chong Ding, Douglas B. White, Stephen A. Scearce, Yaochao Yang, and David Pommerenke

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Design of a 20 GHz Bandwidth Dual-Stage Dual-FIR Channel Emulator, Wei Qian, Atieh Talebzadeh, Guanghua Li, Jianchi Zhou, David Pommerenke, Chong Ding, Douglas B. White, Stephen A. Scearce, and Yaochao Yang

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Design of Conductive Shield for Wireless Power Transfer System for Electric Vehicle Considering Automotive Body, Hongseok Kim, Chiuk Song, DongHyun Kim, and Joungho Kim

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Design of On-Chip Linear Voltage Regulator Module and Measurement of Power Distribution Network Noise Fluctuation at High-Speed Output Buffer, Manho Lee, Heegon Kim, Sukjin Kim, Joungho Kim, Jonghyun Cho, Changwook Yoon, Brice Achkir, Jingook Kim, and Jun Fan

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Design Tips, Bruce Archambeault, Biyao Zhao, Ketan Shringarpure, and James L. Drewniak

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Effects of Time-Variant Non-Linear TSV Parameters on Transient Analysis for Signal Integrity, S. Piersanti, Francesco de Paulis, Antonio Orlandi, Brice Achkir, and Jun Fan

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Efficient Analysis of Power/Ground Planes Loaded with Dielectric Rods and Decoupling Capacitors by Extended Generalized Multiple Scattering Method, Xinxin Tian, Yaojiang Zhang, Dazhao Liu, Liangqi Gui, Qingxia Li, and Jun Fan

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Electrostatic Charging Caused by Standing up from a Chair and by Garment Removal, Atieh Talebzadeh, Mahdi Moradian, Yunan Han, David E. Swenson, and David Pommerenke

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Eliminating Non-Linear RSS Reporting Error in a Radiated RSS-Based TIS Testing Method, Penghui Shen, Yihong Qi, Wei Yu, Fuhai Li, and Jun Fan

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EMI Coupling Paths and Mitigation in a Board-to-Board Connector, Jing Li, Xiao Li, Sukhjinder Toor, Hongmei Fan, Alpesh U. Bhobe, Jun Fan, and James L. Drewniak

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EMI Modeling Method of Interior Permanent Magnet Synchronous Motor for Hybrid Electric Vehicle Drive System Considering Parasitic and Dynamic Parameters, Younghwan Kwack; Hongseok Kim; Chiuk Song; Minkang Moon; DongHyun Kim; and For full list of authors, see publisher's website.

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Equivalent Circuit Modeling of Dielectric Hysteresis Loops in Through Silicon Vias, Stefano Piersanti, Francesco de Paulis, Antonio Orlandi, DongHyun Kim, Joungho Kim, and Jun Fan

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ESD Immunity Prediction of D Flip-Flop in the ISO 10605 Standard using a Behavioral Modeling Methodology, Guangyao Shen, Sen Yang, Victor Khilkevich, David Pommerenke, Hermann L. Aichele, Dirk R. Eichel, and Christoph Keller

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Extraction of Permittivity and Permeability for Ferrites and Flexible Magnetodielectric Materials using a Genetic Algorithm, Shenhui Jing, Yaojiang Zhang, Jing Li, Dazhao Liu, Marina Y. Koledintseva, David Pommerenke, Jun Fan, and James L. Drewniak

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Far-Field Prediction by only Magnetic Near Fields on a Simplified Huygens's Surface, Jingnan Pan, Xu Gao, and Jun Fan

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Fast Approximation of Sine and Cosine Hyperbolic Functions for the Calculation of the Transmission Matrix of a Multiconductor Transmission Line, Nana Dikhaminjia, Jemal L. Rogava, Mikheil Tsiklauri, Mikhail Zvonkin, Jun Fan, and James L. Drewniak

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Frequency-Domain Interpolation of Long Structures for System-Level Signal Integrity Analysis, Mikheil Tsiklauri, Mikhail Zvonkin, Nana Dikhaminjia, Jun Fan, and James L. Drewniak

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High-Speed Serial Link Challenges using Multi-Level Signaling, Nana Dikhaminjia, Junping He, E. Hernandez, Mikheil Tsiklauri, James L. Drewniak, Arun Reddy Chada, Mikhail Zvonkin, and Bhyrav Mutnury

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Impact of Frequency-Dependent and Nonlinear Parameters on Transient Analysis of Through Silicon Vias Equivalent Circuit, Stefano Piersanti, Francesco de Paulis, Antonio Orlandi, and Jun Fan

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Introduction to the Special Issue for the IEEE International Symposium on Electromagnetic Compatibility Held in Raleigh, NC, USA, in August 2014, Jun Fan and Antonio Orlandi

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Investigation of S21 Magnitude Extraction Methodologies by using a Pattern Generator and Sampling Oscilloscope, Xinyun Guo, Ketan Shringarpure, Fadi H. Daou, and Jun Fan

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Measurement-Based Modeling and Worst-Case Estimation of Crosstalk Inside an Aircraft Cable Connector, Guanghua Li, Gary Hess, Robert Hoeckele, Steven A. Davidson, Peter L. Jalbert, Victor Khilkevich, Thomas Van Doren, David Pommerenke, and Daryl G. Beetner

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Measurement Validation for Radio-Frequency Interference Estimation by Reciprocity Theorem, Liang Li, Jingnan Pan, Chulsoon Hwang, Gyuyeong Cho, Harkbyeong Park, Yaojiang Zhang, and Jun Fan

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Modeling Absorbing Materials for EMI Mitigation, Qian Liu, Xiangyang Jiao, Jing Li, Victor Khilkevich, James L. Drewniak, Paul Dixon, and Yoeri Ariën

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Modeling and Analysis of Return Paths of Common Mode EMI Noise Currents from Motor Drive System in Hybrid Electric Vehicle, Minkang Moon; Hongseok Kim; Jinwook Song; Younghwan Kwack; DongHyun Kim; and For full list of authors, see publisher's website.

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Modeling Electromagnetic Field Coupling Through Apertures for Radio-Frequency Interference Applications, Liehui Ren and Jun Fan

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Modeling Human Body Walking Voltage by Human Body Capacitance, Yunan Han, Junchao She, Zhenglin Wen, David Pommerenke, and Lin Dai

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Modeling of Human Body Walking Voltage in Time-Domain, Yunan Han, Junchao She, David Pommerenke, Lin Dai, and Bowen Liu

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Modeling Static Delay Variations in Push–Pull CMOS Digital Logic Circuits Due to Electrical Disturbances in the Power Supply, Xu Gao, Chunchun Sui, Sameer D. Hemmady, Joey Rivera, Susumujoe Yakura, David Pommerenke, Abhishek Patnaik, and Daryl G. Beetner

Multi-Physics Simulations for Triboelectric Charging of Display Panels During the Roller Transfer Process, Kihyuk Kim, David Pommerenke, Yingjie Gan, Namhee Goo, and SeukWhan Lee

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Near-Field Coupling Estimation by Source Reconstruction and Huygens's Equivalence Principle, Liang Li, Jingnan Pan, Chulsoon Hwang, Gyuyeong Cho, Harkbyeong Park, Yaojiang Zhang, and Jun Fan

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Near-Field Scanning for EM Emission Characterization, Jun Fan

New De-Embedding Techniques for PCB Transmission-Line Characterization, Xiaoning Ye, Jun Fan, and James L. Drewniak

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New Methods to Characterize Deterministic Jitter and Crosstalk-Induced Jitter from Measurements, Chunchun Sui, Siqi Bai, Ting Zhu, Christopher Cheng, and Daryl G. Beetner

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On-Chip Linear Voltage Regulator Module (VRM) Effect on Power Distribution Network (PDN) Noise and Jitter at High-Speed Output Buffer, Heegon Kim, Sukjin Kim, Joungho Kim, Changwook Yoon, Brice Achkir, and Jun Fan

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On-Chip Linear Voltage Regulator Module (VRM) Effect on Power Distribution Network (PDN) Noise and Jitter at High-Speed Output Buffer, Heegon Kim, Sukjin Kim, Joungho Kim, Changwook Yoon, Yingook Kim, Brice Achkir, and Jun Fan

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PEEC Macromodels for above Plane Decoupling Capacitors, Xiang Fang, Tamar Makharashvili, Albert E. Ruehli, Jun Fan, James L. Drewniak, Bruce R. Archambeault, and Matteo Cocchini

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Predicting EMI Induced Delay Errors in Integrated Circuits: Sensitivity to the Velocity Saturation Index, Xu Gao, Chunchun Sui, Sameer D. Hemmady, Joey Rivera, Lisa Andivahis, David Pommerenke, and Daryl G. Beetner

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Prediction of Electrostatic Discharge (ESD) Soft Error on Two-Way Radio using ESD Simulation in CST and ESD Immunity Scanning Technique, Rosnah Antong, Danny Low, David Pommerenke, and Mohd Zaid Abdullah

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Prediction of Radiated Emissions from Cables over a Metal Plane using a SPICE Model, Guanghua Li, Wei Qian, Andriy V. Radchenko, Junping He, Gary Hess, Robert Hoeckele, Thomas Van Doren, David Pommerenke, and Daryl G. Beetner

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Prediction of Radiated Emissions from Cables with Multiple Connections to a Metal Plane, Guanghua Li, Gary Hess, Robert Hoeckele, Peter L. Jalbert, Victor Khilkevich, Thomas Van Doren, David Pommerenke, and Daryl G. Beetner

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Quantifying Radiation and Physics from Edge-Coupled Signal Connectors, Xinxin Tian, Matthew S. Halligan, Liangqi Gui, Xiao Li, Kiyeong Kim, Samuel R. Connor, Bruce Archambeault, Michael Andrew Cracraft, Albert E. Ruehli, Qingxia Li, David Pommerenke, and James L. Drewniak

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Quantifying the Impact of FEXT on Eye Margin for Coupled Lines in Inhomogeneous Media, Arun Reddy Chada, Bhyrav Mutnury, Jun Fan, and James L. Drewniak