A Novel De-Embedding Method Suitable for Transmission-Line Measurement

Abstract

A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de-embedded structure is a transmission line. The method only requires two measurement patterns: a true through as test fixture and a total pattern with targeting DUT embedded in. With a quasi-symmetry requirement in test fixtures, it is also a good substitute for newly released two-pattern de-embedding methodologies which have rigid symmetric demanding in text fixtures design and manufactures.

Meeting Name

Asia-Pacific International Symposium on Electromagnetic Compatibility (2015: May 25-29, Taipei, Taiwan)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Center for High Performance Computing Research

Second Research Center/Lab

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Design for testability; Electromagnetic compatibility; Fixtures (tooling); Scattering parameters; De-embedding; Line reflect matches; line-reflect-reflect-match (LRRM); Mixed mode scattering parameters; Scattering parameters measurement; Short-open-load-through; Thru reflect lines; Electric lines; Transmission line

International Standard Book Number (ISBN)

978-1-4799-6670-7

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 May 2015

Link to Full Text

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