Radiation Noise Source Modeling and Application in Near-Field Coupling Estimation
Abstract
Near-field coupling in mixed digital/RF circuit design is critical to system sensitivity for modern high speed electronic systems. This paper presents radiation noise source modeling methods and applies equivalent noise source models to near-field coupling estimations. The noise source can be either modeled by physics-based dipole moment model or Huygens's equivalent model with data obtained from near-field scanning. The fundamental principles of both methods are first studied by simulation. A clock buffer integrated circuit is first modeled as a dipole moment model. The tangential fields on Huygens's box can be calculated by a dipole moment model with negligible multiple scattering effect assumption. The noise coupling then can be obtained by surface integration of Poynting vector at the RF antenna receiving port by full-wave simulation.
Recommended Citation
L. Li et al., "Radiation Noise Source Modeling and Application in Near-Field Coupling Estimation," IEEE Transactions on Electromagnetic Compatibility, vol. 58, no. 4, pp. 1314 - 1321, Institute of Electrical and Electronics Engineers (IEEE), Aug 2016.
The definitive version is available at https://doi.org/10.1109/TEMC.2016.2573160
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electromagnetic waves; Integrated circuit manufacture; Reconfigurable hardware; Full-wave simulations; Fundamental principles; High-speed electronics; Multiple scattering effect; Near-field coupling; Near-field scanning; Noise source models; Surface integration; Dipole moment; Huygens's equivalent model; phase measurement; radio frequency (RF) interference
International Standard Serial Number (ISSN)
0018-9375
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2016
Comments
This work was supported in part by the National Science Foundation under Grant IIP-1440110.