2D Imaging System with Optical Tracking for EMI Source Localization

Author

Hui He
Victor Khilkevich, Missouri University of Science and TechnologyFollow
David Pommerenke, Missouri University of Science and TechnologyFollow

Abstract

This research presents a 2D imaging system with optical tracking to localize radiating sources. Optical tracking system is used for localizing the position of the near field measurement probe. Emission source microscopy (ESM) algorithm derived from synthetic aperture radar (SAR) technique is used to localize radiating sources.

Recommended Citation

H. He et al., "2D Imaging System with Optical Tracking for EMI Source Localization," Proceedings of the 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity (2015, Santa Clara, CA), pp. 107 - 110, Institute of Electrical and Electronics Engineers (IEEE), May 2015.

The definitive version is available at https://doi.org/10.1109/EMCSI.2015.7107668

Meeting Name

2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity (2015: Mar. 15-21, Santa Clara, CA)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Imaging systems; EMI; ESM; Near-field scanning; Optical tracking; SAR; Source localization; Synthetic aperture radar

International Standard Book Number (ISBN)

978-147991991-8

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 May 2015