New Detailed Understanding of the Mechanism of Radiation in Interconnect Problems
Abstract
Electromagnetic radiations from parasitic structures such as electronic interconnections are very difficult to diagnose because the ability to identify the specific sources are missing. Mainly, the source of radiations cannot be identified separately. Here, the partial element equivalent circuit (PEEC) method is extended to diagnose the radiation and its distribution. For the first time we identify the individual sources of radiation and the equivalence circuits for the sources. The proposed approach can be applied to find the radiation for electromagnetic interference (EMI) from a wide variety of structures.
Recommended Citation
Y. S. Cao et al., "New Detailed Understanding of the Mechanism of Radiation in Interconnect Problems," Proceedings of the 25th IEEE Conference on Electrical Performance of Electronic Packaging and Systems (2016, San Diego, CA), pp. 219 - 221, Institute of Electrical and Electronics Engineers (IEEE), Oct 2016.
The definitive version is available at https://doi.org/10.1109/EPEPS.2016.7835454
Meeting Name
25th IEEE Conference on Electrical Performance of Electronic Packaging and Systems (2016: Oct. 23-26, San Diego, CA)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electric Network Analysis; Electromagnetic Pulse; Electronics Packaging; Equivalent Circuits; Partial-Element Equivalent-Circuit Methods; Radiation; Integrated Circuit Modeling; Connectors; Integrated Circuit Interconnections; RLC Circuits; Electric Potential; Mathematical Model; Printed Circuit Interconnections; Electromagnetic Interference; EMI; Electromagnetic Radiations; Parasitic Structures; Electronic Interconnections; Partial Element Equivalent Circuit Method; PEEC Method
International Standard Book Number (ISBN)
978-1509022724; 978-1509061105
International Standard Serial Number (ISSN)
2165-4115
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Oct 2016