Signal-Signal D-Probe and Unified Launch Pad Designs
Abstract
In this paper, two different micro probes (D-probe and GSSG probe) are studied. A specially designed PCB was used to compare the electrical performances of DUTs with de-embedded fixtures for the micro probes and 2.9 mm connectors. Smart Fixture De-embedding (SFD) was used to de-embed the S-parameters of the DUT from the test fixtures. The results showed consistent results of DUTs using both micro probes and 2.92 mm connectors up to nearly 40GHz.
Recommended Citation
Y. Chen et al., "Signal-Signal D-Probe and Unified Launch Pad Designs," IEEE Electromagnetic Compatibility Magazine, vol. 7, no. 3, pp. 101 - 106, Institute of Electrical and Electronics Engineers (IEEE), Oct 2018.
The definitive version is available at https://doi.org/10.1109/MEMC.2018.8479348
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Design for testability; Fixtures (tooling); Organic pollutants; Polychlorinated biphenyls; Scattering parameters; De-embedding; Electrical performance; Launch pads; Micro-probes; Test fixture; Probes; 2.9 mm connector; Differential micro probe; PCB; SFD
International Standard Serial Number (ISSN)
2162-2264
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Oct 2018
Comments
This material is based upon work supported partially by the National Science Foundation under Grant No. IIP-1440110.