De-Embedding Comparisons of 1X-Reflect SFD, 1-Port AFR, and 2X-Thru SFD
Abstract
The procedures of lX-Reflect Smart Fixture De-embedding (SFD), 1-Port Auto Fixture Removal (AFR), and 2X-Thru SFD are compared from various perspectives: test fixture design, the de-embedding procedure, and the de-embedded results. The accuracy of the fixture characterization and de-embedded result is the key figure of merit (FOM) in each de-embedding method. Full-wave models were built to evaluate the FOM of these three methods, by comparing the scattering parameters (S-parameters) and TDR. A test coupon for measuring the USB-C cables is adopted to serve as manufactured validation purpose.
Recommended Citation
Y. Chen et al., "De-Embedding Comparisons of 1X-Reflect SFD, 1-Port AFR, and 2X-Thru SFD," Proceedings of the 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (2018, Singapore, Singapore), pp. 160 - 164, Institute of Electrical and Electronics Engineers (IEEE), May 2018.
The definitive version is available at https://doi.org/10.1109/ISEMC.2018.8393759
Meeting Name
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC (2018: May 14-18, Singapore, Singapore)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Sponsor(s)
National Science Foundation (U.S.)
Keywords and Phrases
1-PortAFR; 2X-Thru SFD; De-embedding; Full-wave model; LX-Reflect SFD; USB-C
International Standard Book Number (ISBN)
978-1-5090-3955-5
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2018
Comments
This paper is based upon work supported partially by the National Science Foundation under Grant No. IIP-1440110.