"Analysis on Via Design for Impedance Mismatch Minimization in High Spe" by Jaemin Lim, Joungho Kim et al.
 

Analysis on Via Design for Impedance Mismatch Minimization in High Speed Channel

Meeting Name

7th Asia-Pacific International Symposium on Electromagnetic Compatibility & Signal Integrity and Technical Exhibition, APEMC 2016 (2016: May 18-21, Shenzhen, China)

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Electromagnetic Compatibility (EMC) Laboratory

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Publication Date

01 May 2016

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