Differential Probe Characterization
Abstract
In this paper, a novel probe without ground pins is proposed for differential signal measurement. An effective model for the differential probe is built in CST based on measured dimensions. To evaluate the electrical performance of the differential probe, a 4-port measurement is performed for a 1 inch differential pair using the probes. Simulation and measurement results match closely which further verifies the accuracy of the simulation model of both the differential probe and PCB under test. Guidance for launching footprint optimization of the differential probe can be extracted based on the sensitivity analysis results in terms of signal pad size, ground via size and ground pad size of the differential probes. Furthermore, loop inductance of the differential probe is evaluated from both 1-port measurement and simulation results.
Recommended Citation
Q. Wang et al., "Differential Probe Characterization," IEEE International Symposium on Electromagnetic Compatibility (2016, Ottawa, Canada), pp. 780 - 785, Institute of Electrical and Electronics Engineers (IEEE), Jul 2016.
The definitive version is available at https://doi.org/10.1109/ISEMC.2016.7571748
Meeting Name
2016 IEEE International Symposium on Electromagnetic Compatibility (2016: Jul. 25-29, Ottawa, Canada)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electromagnetic compatibility; Polychlorinated biphenyls; Sensitivity analysis; Differential pairs; Differential probes; Differential signal; Electrical performance; loop inductanec; Measurement and simulation; Simulation model; Simulations and measurements; Probes; 4-port measurement
International Standard Book Number (ISBN)
978-1-5090-1441-5
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2016