Crosstalk Impact of Periodic-Coupled Routing on Eye Opening of High-Speed Links in PCBs
Abstract
Minimizing costs in printed circuit board layouts has led designers to use two signal layers between the reference planes, which introduce broadside coupling. Additionally, due to the fiber weave effect, designers route signal traces in a zig-zag fashion rather than in straight lines. This type of routing tends to be roughly periodic between the victim and the aggressor. The periodic-coupled routing creates periodic resonances in the near-end crosstalk and nulls in insertion loss (THRU) transfer functions as a consequence of Floquet modes. Due to the periodic resonances, the crosstalk is aggravated, which reduces the signal to crosstalk ratio. This study quantifies the effect of crosstalk due to periodic routing. In addition, design guidelines based on the angle of routing, length of period, and signaling speeds are formulated for designers using statistical bit error rate eye analysis.
Recommended Citation
A. R. Chada et al., "Crosstalk Impact of Periodic-Coupled Routing on Eye Opening of High-Speed Links in PCBs," IEEE Transactions on Electromagnetic Compatibility, vol. 57, no. 6, pp. 1676 - 1689, Institute of Electrical and Electronics Engineers (IEEE), Dec 2015.
The definitive version is available at https://doi.org/10.1109/TEMC.2015.2476700
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Bit error rate; Crosstalk; Design; Printed circuits; High-speed links; Minimizing costs; Near end cross talks; Periodic routing; Printed circuit board layout; Reference plane; Signal to crosstalk ratios; Signal traces; Printed circuit boards; (BER); broadside coupling; Floquet mode; insertion loss (THRU); (NEXT); periodic routing
International Standard Serial Number (ISSN)
0018-9375
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Dec 2015