Quantifying the Impact of FEXT on Eye Margin for Coupled Lines in Inhomogeneous Media

Abstract

Increase in printed circuit board costs is leading to denser routing of high-speed signal traces and to the use of low-cost dielectric materials for high-volume manufacturing. This, in turn, is increasing crosstalk among the traces. The crosstalk between the coupled traces in adjacent layers and the same layers is becoming an important factor to take into account as the signal speed increases. The dielectric media in the vertical stackup may not be homogeneous, and this increases the far-end crosstalk (FEXT) and insertion loss (THRU); thereby, reducing the signal to noise ratio of the high-speed link. This paper investigates the FEXT crosstalk impact on eye opening at a specified bit error rate at different signal speeds for differential coupled traces in inhomogeneous media and compares the results against homogeneous media models. A set of design guidelines regarding the material, coupled length, and stackup parameter selection is formulated for designers based on the signaling speeds.

Department(s)

Electrical and Computer Engineering

Research Center/Lab(s)

Center for High Performance Computing Research

Second Research Center/Lab

Electromagnetic Compatibility (EMC) Laboratory

Keywords and Phrases

Bit error rate; Crosstalk; Printed circuit boards; Printed circuits; Signal to noise ratio; Speed; Dielectric media; Far end crosstalk; High volume manufacturing; High-speed links; High-speed signals; Homogeneous media; Inhomogeneous media; Parameter selection; Dielectric materials; (BER); broadside coupling; (FEXT); insertion loss (THRU)

International Standard Serial Number (ISSN)

0018-9375

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.

Publication Date

01 Dec 2015

Link to Full Text

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