Uniprocessor Mixed-Criticality Scheduling with Graceful Degradation by Completion Rate
Abstract
The scheduling of mixed-criticality (MC) systems with graceful degradation is considered, where LO-criticality tasks are guaranteed some service in HI mode in the form of minimum cumulative completion rates. First, we present an easy to implement admission-control procedure to determine which LO-criticality jobs to complete in HI mode. Then, we propose a demand-bound-function-based MC schedulability test that runs in pseudo-polynomial time for such systems under EDF-VD scheduling, wherein two virtual deadline setting heuristics are considered. Furthermore, we discuss a mechanism for the system to switch back from HI to LO mode and quantify the maximum time duration such recovery process would take. Finally, we show the effectiveness of our proposed method by experimental evaluation in comparison to state-of-the-art MC schedulers.
Recommended Citation
Z. Guo et al., "Uniprocessor Mixed-Criticality Scheduling with Graceful Degradation by Completion Rate," Proceedings of the 2018 IEEE Real-Time Systems Symposium (2018, Nashville, TN), pp. 373 - 383, Institute of Electrical and Electronics Engineers (IEEE), Dec 2018.
The definitive version is available at https://doi.org/10.1109/RTSS.2018.00052
Meeting Name
2018 IEEE Real-Time Systems Symposium, RTSS 2018 (2018: Dec. 11-14, Nashville, TN)
Department(s)
Computer Science
Research Center/Lab(s)
Intelligent Systems Center
Second Research Center/Lab
Center for High Performance Computing Research
Keywords and Phrases
Criticality (nuclear fission); Interactive computer systems; Polynomial approximation; Response time (computer systems); Scheduling; EDF-GVD; Experimental evaluation; Graceful degradation; Mixed criticalities; Recovery process; Schedulability test; State of the art; Uniprocessors; Real time systems
International Standard Book Number (ISBN)
978-1-5386-7908-1
International Standard Serial Number (ISSN)
1052-8725; 2576-3172
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Dec 2018
Comments
The authors are grateful to the input from Prof. Sanjoy Baruah at Washington University at St Louis. This work is partially supported by NSF grants (CNS-1837472, CNS-1850851, CNS-1545050, and CCF-1725755).