Propagation Distances of Surface Electromagnetic Waves in the Far Infrared
The Propagation Distances, Lx, of Surface Electromagnetic Waves on Metal-Air and Semiconductor-Metal-Air Systems Were Measured using the Two Prism Technique in the Far Infrared (84.2 Cm-1). Copper, Gold, Palladium, Tungsten, Nickel, Steel, and Platinum Metal-Air Interfaces Were Studied. Also Semiconductor-Metal-Air Systems Consisting of Pt Films of Varying Thickness Deposited on Single Crystal GaAs Substrates Were Examined. the Experimental Values for Lx Were Found to Be Orders of Magnitude Lower Than Theoretical Values for These Metals. © 1979.
D. L. Begley et al., "Propagation Distances of Surface Electromagnetic Waves in the Far Infrared," Surface Science, vol. 81, no. 1, pp. 245 - 251, Elsevier, Feb 1979.
The definitive version is available at https://doi.org/10.1016/0039-6028(79)90515-6
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02 Feb 1979