Propagation Distances of Surface Electromagnetic Waves in the Far Infrared

Author

D. L. Begley
Ralph William Alexander, Missouri University of Science and TechnologyFollow
C. A. Ward
Richard W. Miller, Missouri University of Science and TechnologyFollow
Robert John Bell, Missouri University of Science and Technology

Abstract

The Propagation Distances, Lx, of Surface Electromagnetic Waves on Metal-Air and Semiconductor-Metal-Air Systems Were Measured using the Two Prism Technique in the Far Infrared (84.2 Cm-1). Copper, Gold, Palladium, Tungsten, Nickel, Steel, and Platinum Metal-Air Interfaces Were Studied. Also Semiconductor-Metal-Air Systems Consisting of Pt Films of Varying Thickness Deposited on Single Crystal GaAs Substrates Were Examined. the Experimental Values for Lx Were Found to Be Orders of Magnitude Lower Than Theoretical Values for These Metals. © 1979.

Recommended Citation

D. L. Begley et al., "Propagation Distances of Surface Electromagnetic Waves in the Far Infrared," Surface Science, vol. 81, no. 1, pp. 245 - 251, Elsevier, Feb 1979.

The definitive version is available at https://doi.org/10.1016/0039-6028(79)90515-6

Department(s)

Physics

International Standard Serial Number (ISSN)

0039-6028

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2023 Elsevier, All rights reserved.

Publication Date

02 Feb 1979