Using Molecular Dynamics Phonon Wave Packet Simulations, We Study Phonon Transmission Across Hexagonal (H)-BN and Amorphous Silica (A-SiO2) Nanoscopic Thin Films Sandwiched by Two Crystalline Leads. Due to the Phonon Interference Effect, the Frequency-Dependent Phonon Transmission Coefficient in the Case of the Crystalline Film (Si|h-BN|Al Heterostructure) Exhibits a Strongly Oscillatory Behavior. in the Case of the Amorphous Film (Si|a-SiO2|Al and Si|a-SiO2|Si Heterostructures), in Spite of Structural Disorder, the Phonon Transmission Coefficient Also Exhibits Oscillatory Behavior at Low Frequencies (Up to ∼1.2 THz), with a Period of Oscillation Consistent with the Prediction from the Two-Beam Interference Equation. above 1.2 THz, However, the Phonon Interference Effect is Greatly Weakened by the Diffuse Scattering of Higher-Frequency Phonons within an A-SiO2 Thin Film and at the Two Interfaces Confining the A-SiO2 Thin Film.
Z. Liang et al., "Phonon Interference in Crystalline and Amorphous Confined Nanoscopic Films," Journal of Applied Physics, vol. 121, no. 7, article no. 75303, American Institute of Physics, Feb 2017.
The definitive version is available at https://doi.org/10.1063/1.4976563
Mechanical and Aerospace Engineering
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21 Feb 2017