Derivation and Application of an Empirical Formula to Describe Interfacial Relaxation Effects in Inhomogeneous Materials

Abstract

We report an empirically derived formula to describe thermally and electrically excited relaxation processes arising in materials with electrical inhomogeneities. This formula was deduced from the temperature and electric field-dependent conductivity of calcium copper titanate ceramics and can be used to explain the Schottky barrier behavior of the grain boundary regions that control conductivities. It relates conductivity, activation energy for conduction, breakdown strength, and grain size effects, and is believed to have the potential to explain the high permittivity and breakdown mechanism, as well as the highly nonlinear current-voltage characteristics of these materials of this type.

Department(s)

Materials Science and Engineering

Sponsor(s)

United States. Office of Naval Research

Keywords and Phrases

Schottky Barrier; Electrical Inhomogeneities; Formula

International Standard Serial Number (ISSN)

0002-7820; 1551-2916

Document Type

Article - Journal

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2007 American Ceramic Society, All rights reserved.

Publication Date

01 Aug 2007

Link to Full Text

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