“The relationship between the formal testing techniques employed and the class of errors that they detect is investigated. This analysis is drawn from results found while testing a hardware description language model of the 8051 microcontroller. The performance of black box, white box, and fault injection verification methodologies is covered. The test models supplied with the code are analyzed and more efficient test sets are examined. The functional errors uncovered during black box testing, the structural faults discovered while performing white box testing, and the combination of both functional and structural defects realized during fault injection testing are discussed”--Abstract, page iii.
Miller, Ann K.
Beetner, Daryl G.
Liu, Xiaoqing Frank
Electrical and Computer Engineering
M.S. in Computer Engineering
University of Missouri--Rolla
viii, 86 pages
© 2000 Gary Cyle Wall, All rights reserved.
Thesis - Restricted Access
Print OCLC #
Link to Catalog Record
Electronic access to the full-text of this document is restricted to Missouri S&T users. Otherwise, request this publication directly from Missouri S&T Library or contact your local library.http://merlin.lib.umsystem.edu/record=b4510761~S5
Wall, Gary Cyle, "Analyzing testing methodologies on a VHDL model of the 8051 microcontroller" (2000). Masters Theses. 1980.
Share My Thesis If you are the author of this work and would like to grant permission to make it openly accessible to all, please click the button above.