Masters Theses

Keywords and Phrases

Exponential distribution; reliability; maximum likelihood estimation; tampered failure rate model

Abstract

"Accelerated life testing is performed to get information quickly about product reliability. A model describing the product's lifespan is used to extrapolate information for nominal stress and other stress levels. This paper describes a method of determining the stress necessary to guarantee (with at least with 90% confidence) that all items fail by the end of a third, accelerated, step, after the test items have been subjected to an initial nominal stress and then a second (accelerated) stress.

We derive and simulate a two-stage step-stress accelerated life test (with three steps) for a product with underlying exponential distribution, assuming a log-linear relationship between stress and mean life. Our work is an extension of the tampered failure rate model introduced by Bhattacharyya and Soejoeti in 1989"-- Abstract, p.iv

Advisor(s)

Samaranayake, V. A.

Committee Member(s)

Gan, Gaoxing
Patel, J.
Wiebe, Henry Allen

Department(s)

Mathematics and Statistics

Degree Name

M.S. in Applied Mathematics

Publisher

University of Missouri--Rolla

Publication Date

Summer 1998

Pagination

vii, 74 pages

Note about bibliography

Includes bibliographical references (pages 71-73)

Rights

© 1998 Phyllis E. Pound Singer, All rights reserved.

Document Type

Thesis - Restricted Access

File Type

text

Language

English

Thesis Number

T 7523

Print OCLC #

42208192

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