Abstract
EMC engineers often use current probes to detect common mode currents. It is necessary to characterize the probes up to Giga Hertz frequencies. Existing calibration methods for current clamps suffer from the problem of not directly measuring the current within the current clamp. Instead they either reconstruct the current from measurements at other locations or they use assumptions regarding the geometry which allows them to use a current that is measured at a different location without applying a mathematical correction. The proposed method overcomes these disadvantages by directly measuring the current at the center of the current clamp. This paper also discusses some oftbe non ideal effects ofcurrent clamps.
Recommended Citation
R. Chundru et al., "A New Calibration Method for Current Probes," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, 2004. EMC 2004, Institute of Electrical and Electronics Engineers (IEEE), Aug 2004.
The definitive version is available at https://doi.org/10.1109/ISEMC.2004.1350018
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility, 2004. EMC 2004
Department(s)
Electrical and Computer Engineering
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2004 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2004
