Abstract
Accurate modeling of chip and chip-package is critical for EMI (Electromagnetic Interference) and RFI (RF Interference) analysis and prediction. in this paper, a model based on an array of dipoles from near-field measurement is proposed. a simple active circuit is simulated in a 3-D full-wave simulation tool, and the dipole model is calculated from the near-field data in the simulation using inverse method with regularization technique. This model has clear physical meaning, and it is validated using field at another place. ©2010 IEEE.
Recommended Citation
Z. Yu et al., "Extracting Physical IC Models using Near-field Scanning," IEEE International Symposium on Electromagnetic Compatibility, pp. 317 - 320, article no. 5711292, Institute of Electrical and Electronics Engineers, Dec 2010.
The definitive version is available at https://doi.org/10.1109/ISEMC.2010.5711292
Department(s)
Electrical and Computer Engineering
International Standard Book Number (ISBN)
978-142446305-3
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2024 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Dec 2010
