Abstract

Active microwave thermography (AMT) is an integrated nondestructive testing and evaluation (NDT&E) technique that features a microwave-based excitation and subsequent thermographic inspection via an infrared camera. AMT has been successfully employed in several industries including aerospace and civil for NDT&E inspections. Since the excitation is microwave-based, an antenna is used to irradiate the sample under test and hence the heating pattern will vary spatially (following the antenna pattern). This nonuniform thermal excitation may limit the ability of AMT to quantify defect cross-sections. Therefore, this work seeks to expand the capabilities of AMT by incorporating a post-processing technique to improve defect cross-section quantification. Specifically, an approach based on the temperature gradient is considered, with results compared to other well-established approaches. The effect of noise is also considered. The results, from both simulation and measurement, indicate that the temperature gradient approach provides the least amount of error in defect cross-section quantification.

Department(s)

Electrical and Computer Engineering

Keywords and Phrases

Active Microwave Thermography (AMT); Canny Edge Detection; Defect Cross-Section Quantification; Nondestructive Testing and Evaluation (NDT&E); Nonuniform Heating; Temperature Gradient

International Standard Book Number (ISBN)

978-166545383-7

International Standard Serial Number (ISSN)

1091-5281

Document Type

Article - Conference proceedings

Document Version

Citation

File Type

text

Language(s)

English

Rights

© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.

Publication Date

2023-01-01

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