Abstract
Active microwave thermography (AMT) is a relatively new nondestructive evaluation method which is proposed in this work for thermal materials characterization. Specifically, AMT is investigated as a single-sided measurement option for out-of-plane thermal diffusivity (a parameter traditionally measured using a two-sided technique). Simulation and measurement results support the use of AMT for such a characterization for materials backed by an electromagnetically absorptive material. Both lossless and lossy materials may be measured, with better accuracy for lossless materials. The effect of heating time was also considered. The results indicate that for the 50 W system used here, 100 seconds of electromagnetic illumination is necessary to achieve less than 10% error in measured out-of-plane thermal diffusivity for lossless and lossy materials.
Recommended Citation
L. M. Wilcox and K. M. Donnell, "Thermal Diffusivity Materials Characterization Via Active Microwave Thermography," Conference Record - IEEE Instrumentation and Measurement Technology Conference, Institute of Electrical and Electronics Engineers, Jan 2023.
The definitive version is available at https://doi.org/10.1109/I2MTC53148.2023.10175955
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Active Microwave Thermography (AMT); Materials Characterization; Nondestructive Testing and Evaluation (NDT&E); Out-of-Plane Thermal Diffusivity
International Standard Book Number (ISBN)
978-166545383-7
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 Institute of Electrical and Electronics Engineers, All rights reserved.
Publication Date
01 Jan 2023
Comments
Missouri University of Science and Technology, Grant AF183-041