Optical Scatter Characteristics Of High-reflectance Dielectric Coatings And Fused-silica Substrates
Abstract
Optical scatter characteristics for high-reflectance dielectric coatings and polished fused-silica substrates are measured. The coating materials are tantala/silica, titania/silica, and zirconia/silica. The coatings are deposited on substrates that are conventionally polished, superpolished, and irradiated with a CO2 laser before deposition. The measurements are made at the design wavelengths of the coatings, i.e., 633 and 1320 nm, and consist of bidirectional-reflectance distribution-function angle scans and spatial mappings. The substrate scatter is lower for superpolished surfaces, and the coating scatter is reduced by the use of superpolished substrates. Scatter levels are strongly influenced by coating design and materials. © 1993 Optical Society of America.
Recommended Citation
S. E. Watkins et al., "Optical Scatter Characteristics Of High-reflectance Dielectric Coatings And Fused-silica Substrates," Applied Optics, vol. 32, no. 28, pp. 5511 - 5518, Optica, Oct 1993.
The definitive version is available at https://doi.org/10.1364/AO.32.005511
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Dielectric coatings; Optical scatter; Surface polishing
International Standard Serial Number (ISSN)
1539-4522; 1559-128X
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2023 Optica, All rights reserved.
Publication Date
01 Oct 1993
Comments
Office of Naval Research, Grant None