Multi-Ports (2ⁿ) 2x-Thru De-Embedding: Theory, Validation, and Mode Conversion Characterization
Abstract
Because of the simplicity of design and measurement, as well as the accuracy of results, the 2x-thru de-embedding has replaced the traditional de-embedding algorithms such as thru-reflect-line and short-open-load-thru for printed circuit board (PCB) characterization. In this paper, the theory of [2n-port 2x-Thru de-embedding is derived first. The self-error reduction schemes are introduced to mitigate the de-embedding errors due to non-ideal manufacturing effects that make mode conversion terms non-zero. Both the theory and the self-error reduction schemes are fully validated through simulation and measurement cases.
Recommended Citation
B. Chen et al., "Multi-Ports (2ⁿ) 2x-Thru De-Embedding: Theory, Validation, and Mode Conversion Characterization," IEEE Transactions on Electromagnetic Compatibility, vol. 61, no. 4, pp. 1261 - 1270, Institute of Electrical and Electronics Engineers (IEEE), Aug 2019.
The definitive version is available at https://doi.org/10.1109/TEMC.2019.2908782
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
2n-Port 2x-Thru De-Embedding; De-Embedding; Far-End Crosstalk (FEXT); Manufacturing Variations; Mixed-Mode; Near-End Crosstalk (NEXT); Self-Error Reduction; Test Fixtures
International Standard Serial Number (ISSN)
0018-9375
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2019
Comments
This work was supported in part by the National Science Foundation under Grant IIP-1440110.