2x-Thru De-Embedding for Non-2ᶰ Even Number Port Network
Abstract
2N-port de-embedding has been well studied previously by using the higher order modal-based S-parameters. Such idea is successfully validated by using the 2x-Thru de-embedding, as well as the classic TRL. Non-2N even number (such as 6, 10, 12, etc.) port network S-parameters de-embedding is derived and validated in this paper. By inserting a factitious single-ended 2x-Thru before the fixture characterization, the derivation and validation are demonstrated through a 6-port 2x-Thru de-embedding example. After the fixture characterization, the inserted artificially single-ended 2x-Thru will be removed before the step of fixture removing calculation. As the 2x-Thru de-embedding application always has even number of port 2x-Thru fixtures, the idea in this paper extend the 2x-Thru de-embedding to any arbitrary number of port. The derivation and justification are also suitable for other de-embedding algorithms with even number of port.
Recommended Citation
B. Chen et al., "2x-Thru De-Embedding for Non-2ᶰ Even Number Port Network," Proceedings of the 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity (2019, New Orleans, LA), pp. 51 - 55, Institute of Electrical and Electronics Engineers (IEEE), Jul 2019.
The definitive version is available at https://doi.org/10.1109/ISEMC.2019.8825207
Meeting Name
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal and Power Integrity, EMC+SIPI 2019 (2019: Jul. 22-26, New Orleans, LA)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
2x-Thru De-Embedding; De-Embedding; Even Mode; Factitious Single-Ended 2X-Thru; Fixture Characterization; Non-2N Even Number Port; Odd Mode
International Standard Book Number (ISBN)
978-153869199-1
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2019 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jul 2019
Comments
This material is based upon work supported partially by the National Science Foundation under Grant No. IIP-1440110.