Abstract
An open-ended waveguide probe including a finite flange extending outwardly and functioning as an infinite flange. A signal source provides a microwave signal to the waveguide, which in turn transmits microwave electromagnetic energy incident upon an object to be tested. The finite flange at the waveguide's aperture is shaped to reduce scattering of the electromagnetic field reflected from the object and received by the aperture. The probe is adapted for coupling to a receiver for sampling the reflected electromagnetic field received by the aperture and the receiver is adapted for coupling to a processor for determining at least one material characteristic of the object based on sampled electromagnetic field reflected from the object.
Recommended Citation
M. T. Ghasr et al., "Waveguide Probe for Nondestructive Material Characterization," U.S. Patents, Jun 2016.
Department(s)
Electrical and Computer Engineering
Patent Application Number
US14/026,754
Patent Number
US20150077138A1
Document Type
Patent
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2015 The Curators of the University of Missouri, All rights reserved.
Publication Date
11 Jun 2016
