TVS Transient Behavior Characterization and Spice based Behavior Model
Abstract
A SPICE model for the transient behavior of TVS devices is presented. TVS devices under ESD stress do not turn on instantaneously and a transient overshoot can be observed at start-up. This model includes small signal RF behavior, quasi-static VI curve, inductive overshoot, conductivity modulation, snapback trigger delay and the ability to be used on any SPICE simulation.
Recommended Citation
P. Wei et al., "TVS Transient Behavior Characterization and Spice based Behavior Model," Proceedings of the 2018 40th Electrical Overstress/Electrostatic Discharge Symposium (2018, Reno, NV), ESD Association, Sep 2018.
The definitive version is available at https://doi.org/10.23919/EOS/ESD.2018.8509780
Meeting Name
2018 40th Electrical Overstress/Electrostatic Discharge Symposium, EOS/ESD 2018 (2018: Sep. 23-28, Reno, NV)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Behavior model; Conductivity modulation; Quasi-static; RF behavior; SPICE modeling; SPICE simulations; Spice-based; Transient behavior; SPICE
International Standard Book Number (ISBN)
978-1-5853-7302-4
International Standard Serial Number (ISSN)
0739-5159
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 ESD Association, All rights reserved.
Publication Date
01 Sep 2018