Root Cause Analysis Methodology of ESD Soft-Failure Applied to a Robot
Abstract
A complex system such as a human assisting robot will have many sensors and use parallel processing for achieving the desired action. During a transient disturbance, such as an electrostatic discharge (ESD), one or many of these sensors can be disturbed. In this study, the detect/presence logic is toggled, consequently, the microcontroller reads the sensor status as disabled. This is a soft-failure which can be recovered by a power cycle of the system. Here a case study is investigated where a methodology is developed to help system designers to understand and model the cause of the sensor failure during an ESD event. This methodology will also help system designers to design efficient filters on the critical signal lines to minimize the effect of coupled noise.
Recommended Citation
A. Patnaik et al., "Root Cause Analysis Methodology of ESD Soft-Failure Applied to a Robot," Proceedings of the 2018 IEEE International Conference on Computational Electromagnetics (2018, Chengdu, China), Institute of Electrical and Electronics Engineers (IEEE), Mar 2018.
The definitive version is available at https://doi.org/10.1109/COMPEM.2018.8496642
Meeting Name
2018 IEEE International Conference on Computational Electromagnetics, ICCEM 2018 (2018: Mar. 26-28, Chengdu, China)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Computation theory; Computational electromagnetics; Electrostatics; Microstrip lines; Outages; Systems analysis; Electrical-fast-transients; Electro-Static Discharge (ESD); Loop impedance; Soft failure; System-level ESD; Tribocharging; Electrostatic devices; Electrical fast transient (EFT); Electrostatic discharge (ESD); Soft-failure; System level ESD; Tribo-charging
International Standard Book Number (ISBN)
978-1-5386-1241-5
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2018 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Mar 2018
Comments
This material is based upon work supported by the National Science Foundation (NSF) under Grants IIP-1440110.