Error Bounds Analysis of De-Embedded Results in 2x thru De-Embedding Methods
Abstract
In this paper, an error bound analysis is performed for 2x thru de-embedding methods: AFR (Automatic Fixture Removal) and SFD (Smart Fixture De-embedding). Basically, a certain amount of error is assumed to exist in S11 of 1x. This error will cause the de-embedded results to vary within a certain range. The upper bound and lower bound of the magnitude of the de-embedded results are given.
Recommended Citation
C. Wu et al., "Error Bounds Analysis of De-Embedded Results in 2x thru De-Embedding Methods," Proceedings of the 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (2017, Washington, DC), pp. 532 - 536, Institute of Electrical and Electronics Engineers (IEEE), Aug 2017.
The definitive version is available at https://doi.org/10.1109/ISEMC.2017.8077927
Meeting Name
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity, EMCSI (2017: Aug. 7-11, Washington, DC)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Sponsor(s)
National Science Foundation (U.S.)
Keywords and Phrases
Electromagnetic compatibility; Error analysis; Fixtures (tooling); De-embedding; De-embedding method; Error bound; Fixture removals; Lower bounds; Upper Bound; Errors; AFR; SFD
International Standard Book Number (ISBN)
978-1-5386-2229-2
International Standard Serial Number (ISSN)
2158-1118
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2017 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 2017
Comments
This paper is based upon work supported partially by the National Science Foundation under Grant No. IIP-1440110.