Modeling, Simulation, and Experimental Investigation of High-Frequency Effects in Power Electronic Based Systems
Abstract
High-frequency problems in power electronic based systems have become of greater concern due to increases in device switching speed, and faster edge rates. Fast device edge rates excite parasitics throughout the system. It is essential for designers to be able to anticipate undesirable electromagnetic compatibility problems that arise as technology continually advances. In this paper the aspects of high-frequency modeling of a 3-phase 5 hp induction motor, a 3-phase 3/4 hp surface-mounted permanent-magnet synchronous machine and drive system (brushless DC machine), and a discrete insulated gate bipolar transistor (IGBT) will be discussed. Computer simulations agree well with measurements.
Recommended Citation
J. L. Tichenor et al., "Modeling, Simulation, and Experimental Investigation of High-Frequency Effects in Power Electronic Based Systems," SAE Technical Papers, Society of Automotive Engineers, Apr 1998.
The definitive version is available at https://doi.org/10.4271/981268
Meeting Name
Aerospace Power Systems Conference (1998: Apr. 21-23, Williamsburg, VA)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Brushless DC Machines; Drive Systems; Electronic Based Systems; Experimental Investigations; High Frequency HF; High-Frequency Effects; High-Frequency Modeling; Parasitics; Permanent Magnet Synchronous Machines; Switching Speed; Computer Simulation; Electromagnetic Compatibility; Insulated Gate Bipolar Transistors (IGBT); Synchronous Machinery; Induction Motors
International Standard Serial Number (ISSN)
0148-7191
Report Number
Technical Paper 981268
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 1998 Society of Automotive Engineers, All rights reserved.
Publication Date
01 Apr 1998
Comments
This work was supported by the University of South Carolina under Grant No. N00014-96- l-0926 with the Office of Naval Research.