Near Field Probe for Detecting Resonances in EMC Application
Resonances degrade the product's EMI or immunity performance at resonance frequencies. Near field scanning techniques, like EMI scanning or susceptibility scanning determine the local behaviour, but fail to connect the local behaviour to the system level behaviour. Resonating structures form part of the coupling paths, i.e., identifying them will aid in understanding system level behaviour of products. In this article, a near field probe (patent pending) is proposed to detecting the resonances frequencies, locations or resonating structures and their Q-factors. The probe is suitable for integration into an automatic scanning system for analysing resonances of PCBs, cables, structural elements etc. The mechanism of the probe has been verified with full wave tools (CST MWS and Ansoft HESS). Two samples of application are presented.
J. Xiao et al., "Near Field Probe for Detecting Resonances in EMC Application," Proceedings of the 2010 Asia-Pacific Symposium on Electromagnetic Compatibility (2010, Bejing, China), pp. 243-246, Institute of Electrical and Electronics Engineers (IEEE), Apr 2010.
The definitive version is available at https://doi.org/10.1109/APEMC.2010.5475739
2010 Asia-Pacific Symposium on Electromagnetic Compatibility (2010: Apr. 12-16, Bejing, China)
Electrical and Computer Engineering
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
At Resonance; Automatic Scanning System; Coupling Paths; Full Waves; near Field Probes; Near-field Scanning; Q-factors; Resonating Structures; Structural Elements; System Levels; Electromagnetic Compatibility; Electromagnetic Field Measurement; Electromagnetism; Polychlorinated Biphenyls; Probes; Scanning; Resonance
International Standard Book Number (ISBN)
International Standard Serial Number (ISSN)
Article - Conference proceedings
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01 Apr 2010