Investigation of the ESD Induced Clock Disturbances in Portable Electronic Products
ESD events can induce noise on the system clock which may lead to soft-errors in the portable electronic products. This paper presents measurement techniques to investigate the ESD induced clock disturbances. At first, the soft-errors due to system level ESD testing on a DUT are shown. Next, local field scanning and direct injection are performed to identify ESD sensitive areas/traces. Techniques for soft-error threshold measurement using synchronized noise injection techniques are shown. Short time FFT (STFFT) based spectrogram method to investigate the PLL output frequency deviation due to the clock line noise, is presented.
V. Pilla et al., "Investigation of the ESD Induced Clock Disturbances in Portable Electronic Products," Proceedings of the 2013 IEEE International Symposium on Electromagnetic Compatibility (2013, Denver, CO), pp. 343-347, Institute of Electrical and Electronics Engineers (IEEE), Aug 2013.
The definitive version is available at https://doi.org/10.1109/ISEMC.2013.6670435
2013 IEEE International Symposium on Electromagnetic Compatibility (2013: Aug. 5-9, Denver, CO)
Electrical and Computer Engineering
Keywords and Phrases
Measurement Techniques; Noise Injection; Output Frequency; Portable Electronics; Sensitive Area; System Clock; System-level ESD; Threshold Measurements; Clocks; Electromagnetic Compatibility; Electrostatic Discharge; Errors; Electrostatic Devices
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Article - Conference proceedings
© 2013 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2013