Broadband Phase Resolving Spectrum Analyzer Measurement for EMI Scanning Applications
Abstract
EMI scanning application requires phase and magnitude information for the creation of equivalent radiation models and for far-field prediction. Magnitude information can be obtained using rather an inexpensive spectrum analyzer (SA). Phase-resolving instruments such as vector network analyzers (VNA) or oscilloscopes are very expensive for frequencies above 5 GHz. For this reason, this paper proposes a method that utilizes a SA for phase-resolved magnitude measurements. The basic principle is to measure the sum or difference of two signals for different phase shifts and deduct the phase from the combined output of those measurements. The phase is retrieved using an optimization procedure. It is shown that the proposed approach can recover phase deviation within 20° when using six steps of variable attenuator control voltage for the test cases between 5 and 12 GHz.
Recommended Citation
Z. Chen et al., "Broadband Phase Resolving Spectrum Analyzer Measurement for EMI Scanning Applications," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2015, Dresden, Germany), vol. 2015-September, pp. 1278 - 1283, Institute of Electrical and Electronics Engineers (IEEE), Sep 2015.
The definitive version is available at https://doi.org/10.1109/ISEMC.2015.7256354
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (2015: Aug. 16-22, Dresden, Germany)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electromagnetic compatibility; Phase shift; Scanning; Spectrum analyzers; Magnitude information; Magnitude measurement; Optimization procedures; Phase deviations; Phase-resolved measurements; Radiation models; Variable attenuators; Vector network analyzers; Electric network analyzers; EMI scanning
International Standard Book Number (ISBN)
978-147996615-8
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Sep 2015