Measurement Techniques to Predict the Soft Failure Susceptibility of an IC Without the Aid of a Complete Software Stack
Abstract
In this paper, several methods are outlined for detecting functional changes in an IC due to external interference such as ESD or EMI. The goal is to provide diagnostic tools for detection of potential soft failure susceptibilities of complex systems during the hardware design stage without the aid of any complex software.
Recommended Citation
S. Yang and B. Orr and Y. Guo and Y. Zhang and D. Pommerenke and H. Shumiya and J. Maeshima and T. Sekine and Y. Takita and K. Araki, "Measurement Techniques to Predict the Soft Failure Susceptibility of an IC Without the Aid of a Complete Software Stack," Proceedings of the 2016 IEEE International Symposium on Electromagnetic Compatibility (2016, Ottawa, Canada), vol. 2016-September, pp. 41 - 45, Institute of Electrical and Electronics Engineers (IEEE), Sep 2016.
The definitive version is available at https://doi.org/10.1109/ISEMC.2016.7571597
Meeting Name
2016 IEEE International Symposium on Electromagnetic Compatibility (2016: Jul. 25-29, Ottawa, Canada)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Electrostatic devices; Electrostatic discharge; Integrated circuits; Testing; Complex software; Diagnostic tools; External interference; Functional changes; Hardware design; Measurement techniques; Soft failure; Software stacks; Electromagnetic compatibility; EMI; ESD
International Standard Book Number (ISBN)
978-150901441-5
International Standard Serial Number (ISSN)
1077-4076
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2016 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Sep 2016
