Analytical Probability Density Calculation for Step Pulse Response of a Single-Ended Buffer with Arbitrary Power-Supply Voltage Fluctuations
Abstract
An analytical methodology to calculate the probability density functions (PDFs) for the step pulse response of a single-ended buffer with arbitrary power-supply voltage fluctuations is proposed. To validate the theory, a silicon IC with noise-aggressing buffers and a victim buffer was designed, fabricated, and assembled in a printed circuit board (PCB). The overall power distribution network (PDN) of the IC and PCB was modeled from impedance measurements. The PDFs of the step pulse response of the victim buffer with power-supply voltage fluctuations were calculated and validated by comparisons with HSPICE and experimental results. The obtained PDFs due to power-supply voltage fluctuations could be combined with the statistical link simulation methods for quick estimation of bit error rate (BER).
Recommended Citation
J. Kim et al., "Analytical Probability Density Calculation for Step Pulse Response of a Single-Ended Buffer with Arbitrary Power-Supply Voltage Fluctuations," IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 61, no. 7, pp. 2022 - 2033, Institute of Electrical and Electronics Engineers (IEEE), Jun 2014.
The definitive version is available at https://doi.org/10.1109/TCSI.2013.2295933
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Bit error rate; Electric network analysis; Organic pollutants; Power distribution network; Power supply; Power supply voltage; Probability density function (pdf); Signal Integrity; Single-ended; Statistical links; Probability density function; power supply induced jitter (PSIJ)
International Standard Serial Number (ISSN)
1549-8328
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Jun 2014