Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network
Abstract
A burst stimulus of data is a common activity in circuits and systems. The supply noise voltage waveform induced by a burst train of integrated circuit (IC) switching currents is rigorously derived for a power distribution network (PDN) with power traces, commonly used in handheld devices. Closed-form expressions are proposed to quickly estimate the amount of voltage drop and overshoot and to develop more complete PDN design methodology as improved target impedances. The proposed PDN noise expressions are also validated with SPICE simulation and measurements using a fabricated IC and PCB.
Recommended Citation
J. Kim et al., "Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network," IEEE Transactions on Electromagnetic Compatibility, vol. 56, no. 6, pp. 1585 - 1597, Institute of Electrical and Electronics Engineers (IEEE), Dec 2014.
The definitive version is available at https://doi.org/10.1109/TEMC.2014.2315837
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Electric network analysis; Burst noise; Burst patterns; overshoot; Power distribution network; Switching currents; Target impedances; Transient noise; SPICE
International Standard Serial Number (ISSN)
0018-9375
Document Type
Article - Journal
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2014 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Dec 2014