Measurement Validation for Radio-Frequency Interference Estimation by Reciprocity Theorem
This paper presents the measurement validation of reciprocity theorem method for near-field coupling estimation. The overall problem is decomposed into two parts, the first part is called forward problem, and the second part is called the reverse problem. For forward problem, the noise source IC is modelled by physics-based dipole moment model with data obtained from a near-field scanning plane, then the tangential E and H fields on a Huygens's box enclosing the victim antenna are calculated by analytical expression. In reverse problem, the victim RF antenna is modelled in full-wave simulation tool and the tangential E and H field are obtained by simulation. With tangential E and H field obtained in forward problem and reverse problem, the coupled noise power is then estimated by reciprocity theorem. The estimated noise coupling power is compared with measured power at the victim antenna port with IC excited. The difference is within 5dB which is acceptable for engineering practice.
L. Li et al., "Measurement Validation for Radio-Frequency Interference Estimation by Reciprocity Theorem," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (2015, Dresden, Germany), pp. 154 - 159, Institute of Electrical and Electronics Engineers (IEEE), Aug 2015.
The definitive version is available at https://doi.org/10.1109/ISEMC.2015.7256150
2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015 (2015: Aug. 16-22, Dresden, Germany)
Electrical and Computer Engineering
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Antennas; Digital radio; Dipole moment; Electromagnetic compatibility; Partial discharges; Radio interference; Radio waves; Scanning antennas; Circuit designs; Near-field coupling; Near-field scanning; Radio frequency interference; Reciprocity theorem; Frequency estimation
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Article - Conference proceedings
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
01 Aug 2015