Near-Field Coupling Estimation by Source Reconstruction and Huygens's Equivalence Principle
Abstract
This study is to estimate the near-field coupling in mixed digital/RF circuit design for modern high speed electronic systems. The noise source IC is first modelled by physics-based dipole moment model with data obtained from a near-field scanning plane. The victim RF antenna is modelled in full-wave simulation tool and the noise IC is further modelled as Huygens's equivalent source. The tangential fields on the Huygens's box can be calculated by dipole moment model with negligible multiple scattering effect assumption. The noise coupling then can be obtained by surface integration of Poynting vector at the RF antenna receiving port. A full-wave simulation model is first studied to demonstrate the method and a noisy clock buffer IC with victim patch antenna is measured for further validation.
Recommended Citation
L. Li et al., "Near-Field Coupling Estimation by Source Reconstruction and Huygens's Equivalence Principle," Proceedings of the 2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity (2015, Santa Clara, CA), pp. 324 - 329, Institute of Electrical and Electronics Engineers (IEEE), Mar 2015.
The definitive version is available at https://doi.org/10.1109/EMCSI.2015.7107708
Meeting Name
2015 IEEE Symposium on Electromagnetic Compatibility and Signal Integrity, EMCSI 2015 (2015: Mar. 14-21, Santa Clara, CA)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Center for High Performance Computing Research
Second Research Center/Lab
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
Antennas; Digital radio; Dipole moment; Electromagnetic waves; Integrated circuit manufacture; Slot antennas; Circuit designs; Huygens; Near-field coupling; Near-field scanning; Radio frequency interference; Microstrip antennas; digital/RF circuit design; Huygens's equivalence principa
International Standard Book Number (ISBN)
978-147991991-8
Document Type
Article - Conference proceedings
Document Version
Citation
File Type
text
Language(s)
English
Rights
© 2015 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Mar 2015