Abstract
EMI from slots and apertures resulting from coupling of interior sources through enclosure cavity modes in a Sun S-1000 workstation was investigated. The excitation of a specially designed rectangular enclosure with a slot was also studied experimentally and with finite-difference time-domain (FDTD) simulations. The radiated power results for both the S-1000 and simple rectangular enclosure indicate that radiation at cavity mode resonance frequencies through slots and apertures can be as significant as at aperture or slot resonances. A decrease of the radiation through the slots and apertures can be achieved by employing a lossy material in the enclosure.
Recommended Citation
M. Li et al., "EMI from Apertures at Enclosure Cavity Mode Resonances," Proceedings of the IEEE International Symposium on Electromagnetic Compatibility (1997, Austin, TX), pp. 183 - 187, Institute of Electrical and Electronics Engineers (IEEE), Aug 1997.
The definitive version is available at https://doi.org/10.1109/ISEMC.1997.667565
Meeting Name
IEEE International Symposium on Electromagnetic Compatibility (1997: Aug. 18-22, Austin, TX)
Department(s)
Electrical and Computer Engineering
Research Center/Lab(s)
Electromagnetic Compatibility (EMC) Laboratory
Keywords and Phrases
EMI; Sun S-1000 Workstation; Aperture Resonance; Apertures; Electromagnetic Interference; Electromagnetic Shielding; Enclosure Cavity Modes; Finite Difference Time-Domain Analysis; Finite-Difference Time-Domain Simulation; Interior Sources Coupling; Radiated Power; Rectangular Enclosure; Slot Resonance; Slots; Workstations; Cavity Resonators; Circuit Resonance; Computer Simulation; Computer Workstations; Electric Excitation; Finite Difference Method; Natural Frequencies; Time Domain Analysis; Cavity Mode Resonances; Electromagnetic Wave Interference
International Standard Book Number (ISBN)
780341406
International Standard Serial Number (ISSN)
0190-1494
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 1997 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 Aug 1997
