Abstract
The embedded modulated scatterer technique (MST) is an innovative tool which can be used for microwave dielectric characterization of infrastructure and composite structures. By impinging a microwave signal on a loaded thin dipole antenna embedded in a material whose dielectric properties are sought, the resulting refelction data can be used to inversely solve for the dielectric properties of interest. Previous investigations utilized reflection information from a single loaded dipole and required known system parameters, such as radiator polarization vs. dipole alignment and relative distance between radiator and probe, to solve for the sought-for dielectric properties. This paper explores a unique application of embedded MST in which the ratio of the reflection coefficients for two independent states of a PIN diode-loaded dipole probe is utilized to significantly simplify the method for calculating dielectric properties.
Recommended Citation
G. S. Freiburger and R. Zoughi, "Dielectric Material Characterization by Complex Ratio of Embedded Modulated Scatterer Technique States," Proceedings of the 22nd IEEE Instrumentation and Measurement Technology Conference (2005: Ottawa, Ontario, Canada), vol. 1, pp. 67 - 71, Institute of Electrical and Electronics Engineers (IEEE), May 2005.
The definitive version is available at https://doi.org/10.1109/IMTC.2005.1604070
Meeting Name
22nd IEEE Instrumentation and Measurement Technology Conference (2005: May 16-19, Ottawa, Ontario, Canada)
Department(s)
Electrical and Computer Engineering
Keywords and Phrases
Dielectric Characterization; Embedded Sensors; Modulated Scatterer Technique; Nondestructive Testing
International Standard Book Number (ISBN)
978-0780388796
International Standard Serial Number (ISSN)
1091-5281
Document Type
Article - Conference proceedings
Document Version
Final Version
File Type
text
Language(s)
English
Rights
© 2005 Institute of Electrical and Electronics Engineers (IEEE), All rights reserved.
Publication Date
01 May 2005
